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排序方式 ： 中图法 所属校区：所有校区 资源类型： 所有资源类型 分类： 所有分类 共有 52629 条记录

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序号 题名 责任者 出版信息 索书号 馆藏/可外借
40951 20017 图书 COMPONENT AND SYSTEMS DIAGNOSTICS,PROGNOSIS,AND HEALTH MANAGEMENT V.4389  BY SPIE  SPIE   2001.4  79.84/S 678  0/0 
40952 20018 图书 APPLICATIONS AND SCIENCE OF COMPUTATIONAL INTELLIGENCE IV V.4390  SPIE  SPIE   2001.4  73.917/S-678  0/0 
40953 20019 图书 WAVELET APPLICATIONS VIII V.4391  SPIE  SPIE   2001.4  73.772/S-678  0/0 
40954 20020 图书 OPTICAL PROCESSING AND COMPUTING A TRIBUTE TO ADOLF LOHMANN V.4392  BY SPIE  SPIE   2001.4  79.84/S 678  0/0 
40955 20021 图书 UNATTENDED GROUND SENSOR TECHNOLOGIES AND APPLICATIONS III V.4393  BY SPIE  SPIE   2001.4  73.274/S 678  0/0 
40956 20022 图书 DETECTION AND REMEDIATION TECHNOLOGIES FOR MINES AND MINELIKE TARGETS VI V.4394 (PART2-1)  BY SPIE  SPIE   2001.4  VOL.4394 (2-1)  0/0 
40957 20023 图书 DETECTION AND REMEDIATION TECHNOLOGIES FOR MINES AND MINELIKE TARGETS VI V.4394 (PART2-2)  BY SPIE  SPIE   2001.4  VOL.4394 (2-2)  0/0 
40958 20024 图书 DIGITAL WIRELESS COMMUNICATION III V.4395  BY SPIE  SPIE   2001.4  73.4616/S 678  0/0 
40959 20025 图书 BATTLESPACE DIGITIZATION AND NETWORK-CENTRIC WARFARE V.4396  BY SPIE  SPIE   2001.4  73.4/S 678  0/0 
40960 20026 图书 11TH INTERNATIONAL SCHOOL ON QUANTUM ELECTRONICS LASER PHYSICS AND APPLICATIONS V.4397  SPIE  SPIE   2000.9  VOL.4397  0/0 
40961 20027 图书 OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION II:APPLICATION IN INDUSTRIAL DESIGN V.4398  BY SPIE  SPIE   2001.6  79.841/S 678  0/0 
40962 20028 图书 OPTICAL MEASURMENT SYSTEMS FOR INDUSTRIAL INSPECTION II:APPLICATION IN PRODUCTION ENGINEERING V.4  BY SPIE  SPIE   2001.6  79.841/S 678  0/0 
40963 20029 图书 SECOND INTERNATIONAL CONFERENCE ON SINGULAR OPTICS (OPTICAL VORTICES):FUNDAMENTALS AND APPLICATIONS  BY SPIE  SPIE   2000.10  VOL.4403  0/0 
40964 20030 图书 LASER BEAM SCINTILLATION WITH APPLICATIONS V. PM 99  BY SPIE  SPIE   2001  73.771/S 678  0/0 
40965 20031 图书 THE BASICS OF SPECTROSCOPY V. TT 49  BY SPIE  SPIE   2001  53.76/S 678  0/0 
40966 20032 图书 LITHOGRAPHY FOR SEMICONDUCTOR MANUFACTURING II V.4404  BY SPIE  SPIE   2001.6  73.73154/S 678  0/0 
40967 20033 图书 PROCESS AND EQUIPMENT CONTROL IN MICROELECTRONIC MANUFACTURING II V.4405  BY SPIE  SPIE   2001.5  73.75/S 678  0/0 
40968 20034 图书 IN-LINE CHARACTERIZATION, YIELD,RELIABILITY, AND FAILURE ANALYSIS IN MICROELECTRONIC MANUFACTURING I  BY SPIE  SPIE   2001.6  73.75/S 678  0/0 
40969 20035 图书 MEMS DESIGN,FABRICATION,CHARACTERIZATION,AND PACKAGING V.4407  BY SPIE  SPIE   2001.6  79.8/S 678  0/0 
40970 20036 图书 DESIGN,TEST,INTEGRATION,AND PACKAGING OF MEMS/MOEMS 2001 V.4408  BY SPIE  SPIE   2001.4  78.1/S 678  0/0 
40971 20037 图书 DIGITAL SHEAROGRAPHY:THEORY AND APPLICATION OF DIGITAL SPECKLE PATTERN SHEARING INTERFEROMETRY V.P  BY SPIE  SPIE   2003  79.8411/S 678  0/0 
40972 20038 图书 PHOTOMASK AND NEXT-GENERATION LITHOGRAPHY MASK TECHNOLOGY VIII V.4409  BY SPIE  SPIE   2001.4  73.73154/S 678  0/0 
40973 20039 图书 FUNDAMENTALS OF ANTENNAS:CONCEPTS AND APPLICATIONS V. TT 50  BY SPIE  SPIE   2001  73.4552/S 678  0/0 
40974 20040 图书 OPTOELECTRONICS APPLICATIONS IN MEDICINE,FOOD TECHNOLOGY AND ENVIRONMENTAL PROTECTION V.4410  BY SPIE  SPIE   2001.12  73.77/S 678  0/0 
40975 20041 图书 LARGE LENSES AND PRISMS V.4411  BY SPIE  SPIE   2001.3  79.84/S 678  0/0 

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