书目详细信息
： Characterization of very high speed semiconductor devices and integrated circuits V.795
书目信息 机读格式(MARC)
| ISBN/价格： | 0-89252-830-3:￥391.45 |
|---|---|
| 题名责任者项： | Characterization of very high speed semiconductor devices and integrated circuits V.795/.by SPIE |
| 出版发行项： | Bay Point:,SPIE:,1987.4 |
| 载体形态项： | 359页:;+16开 |
| 一般附注： | Semiconductors symposium (SPIE‘ critical reviews of optical science and technology series) |
| 个人名称等同： | SPIE |