ISBN/价格: | 1-56677-239-7:¥207.00 |
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题名责任者项: | Analytical and diagnostic techniques for semiconductor materials,devices,and processes V.3895/.SPIE |
版本项: | 1 |
出版发行项: | Bellingham:,The international society for optical engineering:,1999.6 |
载体形态项: | 552页:;+16开 |
一般附注: | Proceedings of SPIE V.3895 |
题名主题: | semiconductor materials |
个人名称等同: | SPIE |
记录来源: | 04/14/00 |