| ISBN/价格: | 0-89252-715-3:¥207.72 |
|---|---|
| 题名责任者项: | Surface characterization and testing V.680/.by SPIE |
| 出版发行项: | San Diego:,SPIE:,1986.8 |
| 载体形态项: | 174页:;+16开 |
| 一般附注: | SPIE‘s annual international technical symposium |
| 题名主题: | INTERFEROMETRY |
| 题名主题: | OPTICAL TEST |
| 题名主题: | SURFACE QUALITY TESTERS |
| 题名主题: | REFLECTORIZED MATERIALS |
| 记录来源: | CN 20061128 |