ISBN/价格: | 0-89252-715-3:¥207.72 |
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题名责任者项: | Surface characterization and testing V.680/.by SPIE |
出版发行项: | San Diego:,SPIE:,1986.8 |
载体形态项: | 174页:;+16开 |
一般附注: | SPIE‘s annual international technical symposium |
题名主题: | INTERFEROMETRY |
题名主题: | OPTICAL TEST |
题名主题: | SURFACE QUALITY TESTERS |
题名主题: | REFLECTORIZED MATERIALS |
记录来源: | CN 20061128 |