ISBN/价格: | 0-89252-734-X:¥256.31 |
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题名责任者项: | International seminar on laser and opto-electronic technology in industry: state-of-the-art review V.699/.by SPIE |
出版发行项: | Xiamen:,SPIE:,1986.6 |
载体形态项: | 197页:;+16开 |
一般附注: | International Seminar on Laser and Opto-Electronic Technology in Industry |
题名主题: | SPECKLE INTERFEROMETRY |
题名主题: | HOLOGRAPHY |
题名主题: | OPTICAL TEST |
题名主题: | HOLOGRAPHIC INTERFEROMETRY |
个人名称等同: | SPIE |